سوابق و تجربیات

IF

Year

Title

The effect of thickness and film homogeneity on the optical and microstructures of the ZrO2 thin films prepared by electron beam evaporation method

R. Shakoury, N. Talebani, A Zelati, Ş Ţălu, A. Arman, S. Mirzaei, A. Jafari

Optical and Quantum Electronics 53 (8), 1-12

Comparing half-metallic, MOKE, and thermoelectric behavior of the CrTiZ (Z= As, P) half-Heuslers: a DFT study

M. Sadeghi, A. Zelati, A. Boochani, A. Arman, S. Mirzaei

Materials Research Express 8 (4), 046302

ISI listed

Deep Reactive Etching of Silica with SF₆/H₂ Plasma: Variation of process parameters and microstructural studies

M. Salehi, G.A. Rad, F. Hafezi, A. Arman, M. Bonjakhi

Vakuum in Forschung und Praxis 33 (2), 40-44

2.478

Optical properties and morphology analysis of hexagonal WO 3 thin films obtained by electron beam evaporation

R. Shakoury, A. Arman, S. Rezaee, A.G. Korpi, S. Kulesza, C. Luna

Journal of Materials Science: Materials in Electronics 32 (1), 798-805

2.658

S. Rezaee, A. Arman, S. Jurečka, A.G. Korpi, F. Mwema, C. Luna, D. Sobola, …

Superlattices and Microstructures 146, 106681

2.084

Stereometric analysis of TiO 2 thin films deposited by electron beam ion assisted

R. Shakoury, A. Arman, Ş. Ţălu, D. Dastan, C. Luna, S. Rezaee

Optical and Quantum Electronics 52, 1-12

2.084

Stereometric analysis of TiO 2 thin films deposited by electron beam ion assisted

R. Shakoury, A. Arman, Ş. Ţălu, D. Dastan, C. Luna, S. Rezaee

Optical and Quantum Electronics 52, 1-12

1.620

Study of the formation of tungsten powder by hydrogen reduction of ammonium paratungstate and stereometric analyses of the powder texture

M. Sadeghi, S. Rezaee, A. Arman, Ş. Ţălu, C. Luna, R. Shakoury

Materials Research Express 6 (12), 1265f7

0.577

The TCVD Growth of CNTs over Copper-Silver-Palladium Nanoparticles Prepared by DC Magnetron Sputtering

S. Rezaee, M. Mardani, R. Shakoury

Acta Phys. Pol., A 137 (6), 1075

4.837

Stereometric and fractal analysis of sputtered Ag-Cu thin films

Ş. Ţălu, RS. Matos, EP. Pinto, S. Rezaee, M. Mardani

Surfaces and Interfaces 21, 100650

2.670

Evaluation of the topographical surface changes of silicon wafers after annealing and plasma cleaning

S. Stach, Ş. Ţălu, R. Dallaev, A. Arman, D .Sobola, M. Salerno

Silicon, 1-8

Microstructure and optical bandgap of cobalt selenide nanofilms

N Ghobadi, F. Hafezi, S. Naderi, F. Amiri, C. Luna, A. Arman, R. Shakoury

Semiconductors 53 (13), 1751-1758

1.620

Stereometric and scaling law analysis of surface morphology of stainless steel type AISI 304 coated with Mn: a conventional and fractal evaluation

R. Shakoury, AG. Korpi, K. Ghosh, Ş. Ţălu, S. Rezaee, F. Mwema, M. Mardan

Materials Research Express 6 (11), 116436

0.577

Improving the Corrosion Resistance of Ni/SS Thin Films by Nitrogen Ion Implantation.

AG. Korpi, A. ARMAN, S. JUREČKA, C. LUNA, R. Shakoury, Ş. ŢĂLU

Acta Physica Polonica, A. 136 (3)

1.620

Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films

AG. Korpi, Ş. Ţălu, M. Bramowicz, A. Arman, S. Kulesza, B. Pszczolkowski

Materials Research Express 6 (8), 086463

ISI listed

Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM)

Ş. Ţălu, RP. Yadav, A. Arman, AG. Korpi, D. Sobola, M. Ţălu, S. Rezaee

Vakuum in Forschung und Praxis 31 (1), 30-35

2.670

Characterization of the ion beam current density of the RF ion source with flat and convex extraction systems

M. Salehi, AA. Zavarian, A. Arman, F. Hafezi, G.A. Rad, M. Mardani, K. Hamze,

Silicon 10 (6), 2743-2749

ISI listed

Behaviors of capacitive and Pirani vacuum gauges: Case study on time effect

AA. Zavarian, A. Arman, SMJ. Ghotbi, AG. Korpi, M. Salehi, M. Mardani

Vakuum in Forschung und Praxis 30 (5), 39-44

3.911

Studies of the micromorphology of sputtered TiN thin films by autocorrelation techniques

K. Smagoń, S. Stach, Ş. Ţălu, A. Arman, A. Achour, C. Luna, N. Ghobadi

The European Physical Journal Plus 132 (12), 1-15

2.478

Study of the microstructure and surface morphology of silver nanolayers obtained by ion-beam deposition

AA. Zavarian, Ș. Țălu, F. Hafezi, A. Achour, C. Luna, S. Naderi, M. Mardani

Journal of Materials Science: Materials in Electronics 28 (20), 15293-15301

9.127

Role of nitrogen doping at the surface of titanium nitride thin films towards capacitive charge storage enhancement

A. Achour, M. Chaker, H. Achour, A. Arman, M. Islam, M. Mardani, M. Boujtita

Journal of Power Sources 359, 349-354

3.315

Plasma surface functionalization of boron nitride nano-sheets

H. Achour, A. Achour, S. Solaymani, M. Islam, S. Vizireanu, A. Arman

Diamond and Related Materials 77, 110-115

2.084

Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films

Ș. Țălu, RP. Yadav, AK. Mittal, A. Achour, C. Luna, M. Mardani, S Solaymani

Optical and Quantum Electronics 49 (7), 1-15

2.084

Synthesis and characterization of porous CaCO 3 micro/nano-particles

A. Achour, A. Arman, M. Islam, AA. Zavarian, AB Al-Zubaidi, J Szade

The European Physical Journal Plus 132 (6), 1-9

2.478

Magnetoresistance of nanocomposite copper/carbon thin films

A. Arman, C Luna, M. Mardani, F. Hafezi, A. Achour, A. Ahmadpourian

Journal of Materials Science: Materials in Electronics 28 (6), 4713-4718