محتوای علمی - سازمان جهاد دانشگاهی صنعتی شریف

[vc_row][vc_column][us_grid taxonomy_category=”%d9%85%d8%ad%d8%aa%d9%88%d8%a7%db%8c-%d8%b9%d9%84%d9%85%db%8c-%d8%ae%d9%84%d8%a7%d8%a1,%d9%85%d8%ad%d8%aa%d9%88%d8%a7%db%8c-%d8%b9%d9%84%d9%85%db%8c-%d8%ae%d9%84%d8%a3,scientific-content-hivac-gr” items_quantity=”12″ no_items_message=”هیچ موردی یافت نشد” pagination=”ajax” items_layout=”37480″ columns=”4″ items_gap=”20px” overriding_link=”post”][/vc_column][/vc_row][vc_row][vc_column][vc_column_text]لیست مقاله های ISI منتشر شده ی گروه پژوهشی خلأ

IF	Year	Title	No.
2.084	2021	The effect of thickness and film homogeneity on the optical and microstructures of the ZrO2 thin films prepared by electron beam evaporation method R. Shakoury, N. Talebani, A Zelati, Ş Ţălu, A. Arman, S. Mirzaei, A. Jafari Optical and Quantum Electronics 53 (8), 1-12	1
1.620	2021	Comparing half-metallic, MOKE, and thermoelectric behavior of the CrTiZ (Z= As, P) half-Heuslers: a DFT study M. Sadeghi, A. Zelati, A. Boochani, A. Arman, S. Mirzaei Materials Research Express 8 (4), 046302	2
ISI listed	2021	Deep Reactive Etching of Silica with SF₆/H₂ Plasma: Variation of process parameters and microstructural studies M. Salehi, G.A. Rad, F. Hafezi, A. Arman, M. Bonjakhi Vakuum in Forschung und Praxis 33 (2), 40-44	3
2.478	2021	Optical properties and morphology analysis of hexagonal WO 3 thin films obtained by electron beam evaporation R. Shakoury, A. Arman, S. Rezaee, A.G. Korpi, S. Kulesza, C. Luna Journal of Materials Science: Materials in Electronics 32 (1), 798-805	4
2.658	2020	Effect of annealing on the micromorphology and corrosion properties of Ti/SS thin films S. Rezaee, A. Arman, S. Jurečka, A.G. Korpi, F. Mwema, C. Luna, D. Sobola, … Superlattices and Microstructures 146, 106681	5
2.084	2020	Stereometric analysis of TiO 2 thin films deposited by electron beam ion assisted R. Shakoury, A. Arman, Ş. Ţălu, D. Dastan, C. Luna, S. Rezaee Optical and Quantum Electronics 52, 1-12	6
2.084	2020	Stereometric analysis of TiO 2 thin films deposited by electron beam ion assisted R. Shakoury, A. Arman, Ş. Ţălu, D. Dastan, C. Luna, S. Rezaee Optical and Quantum Electronics 52, 1-12	7
1.620	2020	Study of the formation of tungsten powder by hydrogen reduction of ammonium paratungstate and stereometric analyses of the powder texture M. Sadeghi, S. Rezaee, A. Arman, Ş. Ţălu, C. Luna, R. Shakoury Materials Research Express 6 (12), 1265f7	8
0.577	2020	The TCVD Growth of CNTs over Copper-Silver-Palladium Nanoparticles Prepared by DC Magnetron Sputtering S. Rezaee, M. Mardani, R. Shakoury Acta Phys. Pol., A 137 (6), 1075	9
4.837	2020	Stereometric and fractal analysis of sputtered Ag-Cu thin films Ş. Ţălu, RS. Matos, EP. Pinto, S. Rezaee, M. Mardani Surfaces and Interfaces 21, 100650	10
2.670	2019	Evaluation of the topographical surface changes of silicon wafers after annealing and plasma cleaning S. Stach, Ş. Ţălu, R. Dallaev, A. Arman, D .Sobola, M. Salerno Silicon, 1-8	11
0.674	2019	Microstructure and optical bandgap of cobalt selenide nanofilms N Ghobadi, F. Hafezi, S. Naderi, F. Amiri, C. Luna, A. Arman, R. Shakoury Semiconductors 53 (13), 1751-1758	12
1.620	2019	Stereometric and scaling law analysis of surface morphology of stainless steel type AISI 304 coated with Mn: a conventional and fractal evaluation R. Shakoury, AG. Korpi, K. Ghosh, Ş. Ţălu, S. Rezaee, F. Mwema, M. Mardan Materials Research Express 6 (11), 116436	13
0.577	2019	Improving the Corrosion Resistance of Ni/SS Thin Films by Nitrogen Ion Implantation. AG. Korpi, A. ARMAN, S. JUREČKA, C. LUNA, R. Shakoury, Ş. ŢĂLU Acta Physica Polonica, A. 136 (3)	14
1.620	2019	Minkowski functional characterization and fractal analysis of surfaces of titanium nitride films AG. Korpi, Ş. Ţălu, M. Bramowicz, A. Arman, S. Kulesza, B. Pszczolkowski Materials Research Express 6 (8), 086463	15
ISI listed	2019	Analyzing the fractal feature of nickel thin films surfaces modified by low energy nitrogen ion: Determination of micro‐morphologies by atomic force microscopy (AFM) Ş. Ţălu, RP. Yadav, A. Arman, AG. Korpi, D. Sobola, M. Ţălu, S. Rezaee Vakuum in Forschung und Praxis 31 (1), 30-35	16
2.670	2018	Characterization of the ion beam current density of the RF ion source with flat and convex extraction systems M. Salehi, AA. Zavarian, A. Arman, F. Hafezi, G.A. Rad, M. Mardani, K. Hamze, Silicon 10 (6), 2743-2749	17
ISI listed	2018	Behaviors of capacitive and Pirani vacuum gauges: Case study on time effect AA. Zavarian, A. Arman, SMJ. Ghotbi, AG. Korpi, M. Salehi, M. Mardani Vakuum in Forschung und Praxis 30 (5), 39-44	18
3.911	2017	Studies of the micromorphology of sputtered TiN thin films by autocorrelation techniques K. Smagoń, S. Stach, Ş. Ţălu, A. Arman, A. Achour, C. Luna, N. Ghobadi The European Physical Journal Plus 132 (12), 1-15	19
2.478	2017	Study of the microstructure and surface morphology of silver nanolayers obtained by ion-beam deposition AA. Zavarian, Ș. Țălu, F. Hafezi, A. Achour, C. Luna, S. Naderi, M. Mardani Journal of Materials Science: Materials in Electronics 28 (20), 15293-15301	20
9.127	2017	Role of nitrogen doping at the surface of titanium nitride thin films towards capacitive charge storage enhancement A. Achour, M. Chaker, H. Achour, A. Arman, M. Islam, M. Mardani, M. Boujtita Journal of Power Sources 359, 349-354	21
3.315	2017	Plasma surface functionalization of boron nitride nano-sheets H. Achour, A. Achour, S. Solaymani, M. Islam, S. Vizireanu, A. Arman Diamond and Related Materials 77, 110-115	22
2.084	2017	Application of Mie theory and fractal models to determine the optical and surface roughness of Ag–Cu thin films Ș. Țălu, RP. Yadav, AK. Mittal, A. Achour, C. Luna, M. Mardani, S Solaymani Optical and Quantum Electronics 49 (7), 1-15	23
2.084	2017	Synthesis and characterization of porous CaCO 3 micro/nano-particles A. Achour, A. Arman, M. Islam, AA. Zavarian, AB Al-Zubaidi, J Szade The European Physical Journal Plus 132 (6), 1-9	24
2.478	2017	Magnetoresistance of nanocomposite copper/carbon thin films A. Arman, C Luna, M. Mardani, F. Hafezi, A. Achour, A. Ahmadpourian Journal of Materials Science: Materials in Electronics 28 (6), 4713-4718	25

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